The SpecEl-2000-VIS Ellipsometer measures polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength. The SpecEl is controlled via a PC. Measure refractive index, absorbance and thickness with the touch of a button.
All-in-one Accurate System
The SpecEl houses an integrated light source, a spectrometer and two polarizers fixed to 70°. It also includes a PC with a 32-bit Windows operating system. The SpecEl can detect a single layer as thin as 0.1 nm and up to 5 µm thick. In addition, it can provide refractive indices to 0.005°.
The SpecEl is available for Call for Price.
SpecEl Software and "Recipe" Files
In SpecEl Software, you can configure and save experiment method files for one-step analysis. after creating a "recipe," you can select the recipe to execute the experiment.
Specifications
Wavelength range:
380-780 nm (standard) or 450-900 nm (optional)
Optical resolution:
4.0 nm FWHM
Accuracy:
0.1 nm thickness; 0.005% refractive index
Angle of incidence:
70°
Film thickness:
1-5000 nm for single transparent film
Spot size:
2 mm x 4 mm (standard) or 200 µm x 400 µm (optional)