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SpecEl Ellipsometer System  

The SpecEl-2000-VIS Ellipsometer measures polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength. The SpecEl is controlled via a PC. Measure refractive index, absorbance and thickness with the touch of a button.

All-in-one Accurate System

The SpecEl houses an integrated light source, a spectrometer and two polarizers fixed to 70°. It also includes a PC with a 32-bit Windows operating system. The SpecEl can detect a single layer as thin as 0.1 nm and up to 5 µm thick. In addition, it can provide refractive indices to 0.005°.

The SpecEl is available for Call for Price.

SpecEl Software and "Recipe" Files

In SpecEl Software, you can configure and save experiment method files for one-step analysis. after creating a "recipe," you can select the recipe to execute the experiment.

Specifications

Wavelength range: 380-780 nm (standard) or 450-900 nm (optional)
Optical resolution: 4.0 nm FWHM
Accuracy: 0.1 nm thickness; 0.005% refractive index
Angle of incidence: 70°
Film thickness: 1-5000 nm for single transparent film
Spot size: 2 mm x 4 mm (standard) or 200 µm x 400 µm (optional)
Sampling time: 3-15 seconds (minimum)
Kinetic logging: 3 seconds
Mechanical tolerance (height): +/- 1.5 mm, angle +/- 1.0°
Number of layers: Up to 32 layers
Reference: Not applicable

椭偏仪信息由广州标旗电子科技有限公司为您提供,如您想了解更多关于椭偏仪报价、型号、参数等信息,欢迎来电或留言咨询。

注:该产品未在中华人民共和国食品药品监督管理部门申请医疗器械注册和备案,不可用于临床诊断或治疗等相关用途

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