Image Gallery
Seeing is Believing! The images below were acquired using similar configurations to the SPM-M Kit.
Si (111) Atomic Steps (312pm monatomic layer thickness) 2µm x 2µm Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and etched tungsten tip on a quartz tuning fork. Si (111) Atomic Steps (312pm monatomic layer thickness) 1.76µm x 2.02µm Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and Akiyama probe. Calibration grid (100nm tall lines, 2µm apart) 10µm x 10µm Unidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and Akiyama probe. Calibration grid (100nm tall pegs, spaced 2µm apart) 10µm x 10µm Unidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and Akiyama probe.Fly eye 100µm x 100µm Bidirectional scan PLL mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.Human hair 100µm x 100µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.PMMA pattern, uncured 10 µm x 10 µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.Integrated circuit 100 µm x 100 µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.Calibration grid 40 µm x 40 µm Unidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.Calibration grid (100nm tall, 10µm pitch) 70 µm x 70 µm Unidirectional scan PLL mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.Etched structures 80 µm x 80 µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.
|