The 646 Double Tilt Analytical Holder incorporates design features optimized for electron diffraction and EDX analysis of crystalline TEM specimens.
主要特点:
Key Features Low background design
Beryllium specimen cradle, Hexring® and Anti-twist washer to gently and securely hold the specimen in place ToggleTilt™ beta drive mechanism
Robust operation with no mechanical binding of the specimen cradle at tilt limits Maximum +/- 30° using TEM control Maximum +/- 45° using Accutroller Reduced Shadowing
Optimized for EDX analysis Integral Faraday Cage
Quantitative measurement of the incident electron current Tilt ranges and compatibility of specimen holders vary according to the TEM manufacturer, model, pole piece gap, and the presence of in-gap accessories. Please contact your local Gatan representative for more information.