Atomic force microscopy has been gaining an incredible amount of interest among today’s leading life science researchers and educators, both due to its nanoscale imaging capabilities and the physical interaction between the
Stimulated by AFM users’ need for greater AFM efficiency, Bruker set out to develop a system that could scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. Now, with
12月7日上午,布鲁克纳米表面仪器部应用专家孙昊博士在中山大学进行了力学测量技术的新进展和峰值力扫描电化学显微镜专题讲座。中山大学的原子力显微镜用户参加了此次讲座。专题讲座主要介绍了两个专题:1. Advances in mechanical properties measurement of nano-materials characterization by Bruker AFM,主要介绍近两年布鲁克AFM在测量力学方面的一些进展,包括对力曲线和For