Measurement modes: 测量模式: Motion patterns at the measurements: - area (matrix); - line; - single point. | Contact static AFM 接触静态 Lateral force microscopy /with contact static AFM/ 横向力显微镜/用静态接触AFM Non-contact dynamic AFM 非接触式动态AFM Intermittent contact AFM (similar to Tapping Mode®) 间隙接触(敲击) Phase contrast imaging /with intermittent contact AFM/ 相衬成像/用间隙接触AFM Two-pass mode (for static and dynamic AFM) 6. 两回合模式(适合静态与动态AFM) Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/两回合模式,伴随变化的间距, Multicycle scanning (for static and dynamic AFM) /Original technique!/多回合扫描(适合静态与动态AFM) Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/多回合扫描,伴随变化的载荷(适合静态与动态AFM) Electrostatic force microscopy (two-pass technique) *, **静电力显微镜(双回合技术) Current mode *, **电流模式 Magnetic force microscopy (two-pass technique) *, **磁力显微镜(双回合技术) Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)静态力谱(在测量点,计算定量参数、表面能与弹性模量) Dynamic force spectroscopy动态力谱 Dynamic frequency force spectroscopy /Original technique!/动态频率力谱 Nanoindentation *纳米压痕 Nanoscratching *纳米划痕 Linear nanowear *线性纳米磨损 Nanolithography (with control of <i> load, <ii> depth and <iii> bias voltage) *纳米光刻(控制力,深度,偏压) Microtribometry * /Original technique!/微观摩擦力计量 Microadhesiometry * /Original technique!/微观附着力计量 Shear-force microtribometry * /Original technique!/剪切力微观摩擦力计量 Temperature-dependent measurements (under all above modes) *基于温度的测量(适用于所以以上模块)
Note. * - Specialized accessories or rig required*需要特殊的附件或工具 ** - Specialized probes required **需要特殊的探针 |
Scan field area:扫描面积 | from 5x5 micron up to 50x40 microns |
Maximum range of measured heights:最大高度范围 | from 2 to 4 micron |
Lateral resolution (plane XY):侧面分辨率 | 1–5 nm (depending on sample hardness) |
Vertical resolution (direction Z):竖直分辨率 | 0.1–0.5 nm (depending on sample hardness) |
Scanning matrix:扫描矩阵 | Up to 1024x1024 points |
Scan rate:扫描速度 | 40–250 points per second in X-Y plane |
Nonlinearity correction :非线性校正 | A software nonlinearity correction provided |
Minimum scanning step:最小扫描步阶 | 0.3 nm |
Scanning scheme:扫描步骤 | The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe. |
Scanner type:扫描器类型 | A piezoceramic tube. |
Cantilevers (probes):悬臂(探针) | Commercial AFM cantilevers of 3.4x1.6x0.4 mm. Recommended are probes from Mikromasch or NT-MDT. Checked for operation with probes by BudgetSensor and Nanosensors |
Cantilever deflection detection system:悬臂倾斜探测系统 | Laser beam scheme with four-quadrant position-sensitive photodetector |
Sample size:样品尺寸 | Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm |
High voltage amplifier output: 高压放大器输出 | +190 V |
ADC: | 16 bit |
Operation environment:操作环境 | Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70% |
Range of automated movement of measuring head:测量头自动移动范围 | 10x10
mm in XY plane for micropositioning of probe relative measured sample
at step 2.5 micron with optical visual monitoring |
Overall dimensions:总尺寸 | Scanning unit: 185x185x290 mm Control electronic unit: 195x470x210 mm |
Field of view of embedded videosystem:植入视频系统的视场 | 1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps. |
Vibration isolation:防震隔离 | Additional antivibration table is recommended |
Host computer:控制计算机 | Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port. Recommended: Core i5 or equivalent, RAM 2 GB, HDD 320 GB, VRAM 1 GB, monitor 1600x1200x32 bit, Windows® XP SP2 or higher, 2 free USB port. |
Software:软件 | Special control software SurfaceScan and the AFM image processing package SurfaceView / SurfaceXplorer are included. |