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样品台移动范围 | 100微米 | 样品尺寸 | 直径小于15毫米 |
定位检测噪声 | 0.15nm |
Instant AFM and nanoprobe instrumentation - just add science! View our AFM Video Tutorial. |
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IntroductionMadPLL® is a powerful instrument package that allows the user to create an inexpensive, high resolution resonant scanning probe microscope using Mad City Labs nanopositioning systems. In short, MadPLL® can be used to create an “instant” closed loop AFM or NSOM at a fraction of the cost of commercial systems. MadPLL® is suitable for nanoscale characterization and nanoscale fabrication applications such as optical antennas, nano-optics, semiconductors, data storage, and more. |
What is MadPLL®?MadPLL® is an integrated solution that includes the digital phase lock loop (PLL) controller, software, sensor amplifier board and resonant probe mounting board. Simply add your Akiyama probe or tuning fork to the probe board to create a powerful force sensor for scanning probe measurements.
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MadPLL® SoftwareMadPLL® software simplifies the control of your scanning probe microscope. All of the functions of MadPLL® are fully automated but accessible via individual software control. Among the software features are automated setup, configuration control, auto-Q calculation and automatic parasitic capacitance compensation (PCC) control. These included features are designed to simplify setup and accelerate the data acquisition process. MadPLL® software integrates seamlessly with Mad City Labs' AFMView™ software. AFMView™ software is part of our complete SPM development system. |
Application - AFM Video TutorialInstant AFM - just add science!
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Image GallerySeeing is Believing!
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Technical SpecificationsLock-In AmplifierPhase Shifter0° to 360°Demodulation Bandwidth3 kHz |
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MCL MadPLL®原子力显微镜控制器,MadPLL®
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