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| 参考报价： | 面议 | 型号： | X-PREP® VISION™ |
| 品牌： | 安奈特 | 产地： | 美国 |
| 关注度： | 10 | 信息完整度： |  |
| 样本： | 典型用户： | 暂无 | |
| 供应商性质 | 生产商 | 产地类别 | 进口 |
| 价格范围 | 10万-30万 |
400-6699-117转1000
The X-Prep® fixture adapter is also secured to the motorized stage on the X-Prep® Vision™, ensuring the measurement/tool control coordinates remain aligned when transferred between systems.
A library with over 130 materials (i.e., GaAs, InGaAs, SiC, Sapphire/Al2O3, InP, SiGe, GaN, photo-resist) is included with every system.
Meaurement & Observation - How it Works
IR light is focused onto a sample, and a unique signal based on the refractive index of the material is created. The return signal is analyzed by the software to produce a thickness value.
Meauring Below 10 μm Thickness
For applications requiring thinning to less than 10 μm, precise measurement is possible only by adding the visible light spectrometer accessory.
| Multipoint scan or single-point thickness measurement | 10 microns to full thickness (1 mm) range of measurement (15 nm to 1 mm thick when configured with #15-51000 Spectrometer) | |
| Motorized, automatic X/Y/Z (auto-focus) with <1s acquisition time | Automatic edge and corner detection aligns measurement grid with X-Prep® - including theta correction | |
| Edge exclusion with X/Y input | Stage fitted with X-Prep® fixture adapter | |
| "Drive to Coordinate" software navigation | Viewing of either 2D plot/map or 3D graph | |
| Supplied with Allied proprietary X-Correct™ software | CCD camera (#15-50020) must be purchased separately if not purchasing Visible Light Spectrometer (#15-51000) | |
| Roughness - 15 micron finish | 100 mm x 100 mm stage travel | |
| Software automation extendable through .NET | Data export using standard Windows methods | |
| One (1) year warranty | Dimensions: 14" W x 17" D x 19" H (355 x 431 x 483 mm) |
Allied基材厚度测量仪 X-PREP® VISION™信息由似空科学仪器（上海）有限公司为您提供，如您想了解更多关于Allied基材厚度测量仪 X-PREP® VISION™报价、型号、参数等信息，欢迎来电或留言咨询。
注：该产品未在中华人民共和国食品药品监督管理部门申请医疗器械注册和备案，不可用于临床诊断或治疗等相关用途
