Fischione等离子清洗仪1020

在将样品插入电子显微镜之前,利用等离子清洗仪立即对其进行清洗，清除样品表面的污染物、并防止在成像和分析过程中发生积碳及污染。同时对电镜样品台/杆、光榆等各类电镜部件进行清洗,可保证电镜真空的洁净度,减少换样时间。

主要性能特点：

·可清洗样品及样品台/杆及各类电镜部件
·污染严重样品也可在2min内完成清洗
·清洗过程不改变样品的元素组成及结构
·采用无油真空设计
·采友好的人机控制界面
·适配所有品牌所有型号透射电镜样品杆
·同时可适用于扫描电镜及其他表面分析科学仪器样品及样品台的清洗
·方便扩展透射电镜样品杆存储架

技术优势：

> Simultaneously cleans transmission and scanning electron microscope specimens and specimen holders
> Enhances imaging and analytical results
> Removes existing carbonaceous contamination
> Prevents contamination
> No etching or sputtering
> Storage in clean vacuum

Simultaneously cleans electron microscopy specimens and holders
The Plasma Cleaner automatically and quickly removes organic contamination (hydrocarbon) from electron microscopy specimens and specimen holders. A low energy, reactive gas plasma cleans without changing the specimen’s elemental composition or structural characteristics. The Plasma Cleaner features easy-to-use front panel controls and an oil-free vacuum system for optimal processing.

Enhanced imaging and analysis
Cleaning is solely by reactive gas compounds formed by the plasma chemically reacting with carbonaceous material on the specimen and specimen holder. The nonequilibrium, high-frequency plasma is generated with a gas mixture of 25% oxygen and 75% argon. Free electrons are accelerated to high velocities by an oscillating electromagnetic field (13.56 MHz) that excites gas atoms and creates the plasma. The plasma ions impinge upon the surface with energies of less than 12 eV, which is below the specimen’s sputtering threshold.

In electron microscopes with high brightness electron sources, specimens that are not plasma treated tend to contaminate. The Plasma Cleaner ensures confidence that carbonaceous contamination will not interfere with imaging or analysis, even during fine probe microanalysis for extended periods.

Standard and specialized specimen holders
The Plasma Cleaner readily accepts side-entry specimen holders for all commercial transmission electron microscopes, as well as scanning electron microscope samples and a wide variety of bulk materials. A specialized specimen holder port allows the cleaning of specimens contained on carbon

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