400-6699-117转1000
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工商注册信息已核实!参考报价: | 面议 | 型号: | Multilayers XS-55, XS-N, XS-C, XS-B |
品牌: | incoatec | 产地: | 德国 |
关注度: | 11 | 信息完整度: | |
样本: | 典型用户: | 暂无 | |
产地类别 | 进口 | 供应商性质 | 总代理 |
组件类别 | 光学元件 |
组件类别 | 光学元件 |
400-6699-117转1000
Multilayers XS-55, XS-N, XS-C, XS-B
Multilayers are not natural crystals but artificially produced “layer analyzers.” The lattice plane distances d
are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers
are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light
elements the multilayer technique presents an almost revolutionary improvement for numerous
applications in comparison to natural crystals with large lattice plane distances.
Fig. 18: Diffraction in the layers of a multilayer crystal
XS-55:
The most commonly used multilayer with a 2d-value of 5.5 nm for analyzing the elements N to Al and Ca
to Br; standard application for measuring the elements F, Na and Mg.
多层膜型XRF分析晶体信息由 北京众星联恒科技有限公司为您提供,如您想了解更多关于多层膜型XRF分析晶体报价、型号、参数等信息,欢迎来电或留言咨询。
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