布鲁克(北京)科技有限公司-纳米表面仪器

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用AFM做力调制成像

发布时间: 2015-11-15 16:13 来源: 布鲁克(北京)科技有限公司-纳米表面仪器
样品:抛光的连接部分carbon/epoxy 组成,在aeronautics, bicycle frames, and golf clubs项目:localized studies of relative difference in surface elasticity with nanometer-scale resolution
参考:科研

下载地址: 用AFM做力调制成像


Force modulation imaging is an atomic force microscopy (AFM) technique that identifies and maps differences in surface stiffness or elasticity1. It is one of several techniques developed as extensions of AFM. These techniques probe various surface properties to differentiate between the different materials that make up heterogeneous surfaces. Force modulation imaging has many applications, including locating transitions between different components in composites, rubber, and polymer blends; imaging organic materials on hard substrates; detecting residual photoresist on integrated circuits; and identifying contaminants on various surfaces.

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