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NPFLEX 3D Surface Metrology System

发布时间: 2014-02-24 16:23 来源:布鲁克(北京)科技有限公司-纳米表面仪器

下载地址2:B512-RevB0-NPFLEX-Brochure.pdf


NPFLEX 3D Surface Metrology System

for Large-Sample, Non-Contact Measurement & Analysis

• Characterize Large Shapes and Critical Angles
— Measurement Flexibility
• Collect High-Density, 3D Areal Information
— Definitive Results
• Measure with Nanometer Resolution
— Revealed Detail
• Perform Rapid Repeatable Data Acquisition

Bruker’s NPFLEX™ 3D Surface Metrology System brings unprecedented measurement capability and performance to precision manufacturing industries, enabling faster ramp-up times, improved product quality, and increased productivity. Based on white light interferometry, this non-contact system offers many benefits beyond such traditional contact measurement technologies as coordinate measuring machines (CMMs) and industrial stylus profilers. These benefits include three-dimensional (3D) images, rapid data-rich acquisition, and greater insight into part performance and functionality. The culmination of decades of expertise in interferometric technology and large-sample instrument design, the NPFLEX is the first optical metrology system to handle micro to macro features effortlessly on samples of widely varying sizes.

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