布鲁克(北京)科技有限公司-纳米表面仪器
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DektakXT 第十代探针式表面轮廓仪-英文介绍

发布时间: 2014-02-21 11:15 来源:布鲁克(北京)科技有限公司-纳米表面仪器
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B516 Rev A1 DektakXT-Brochure (LoRes).pdf

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  Bruker’s DektakXT™ Stylus Profiler features a revolutionary design that enables unmatched repeatability that is better than 5 angstroms. This major milestone in stylus profiler performance is the culmination of over forty years of Dektak® innovation and industry leadership. Through its combination of industry firsts, DektakXT delivers the ultimate in performance, ease of use and value to enable better process monitoring from R&D to QC. The technological breakthroughs incorporated in this 10th generation Dektak enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science industries.

  DektakXT Delivers

  ■ Unmatched performance with better than 5Å repeatability

  – Single-arch design provides breakthrough scan stability

  – Leading-edge “smart electronics” establish new low noise benchmark

  – New hardware configuration offers 40% faster data collection times than prior generations

  – 64-bit, parallel processing Vision64 software architecture delivers up to 10 times faster data analyses

  ■ Unprecedented efficiency and ease of use

  – Intuitive Vision64™ user interface workflow simplifies operation

  – Self-aligning styli enables effortless tip exchange

  ■ Incomparable value from the world leader in stylus profilers

  – Bruker delivers premier performance in an affordable package

  – Single sensor design offers low force and extended range in a single platform

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