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用AFM探测纳米尺度的力

发布时间: 2015-11-15 15:59 来源:布鲁克(北京)科技有限公司-纳米表面仪器

下载地址:用AFM探测纳米尺度的力


Probing Nano-Scale Forces with the Atomic Force Microscope


The ability of the atomic force microscope (AFM) to create three-dimensional micrographs with resolution down to the nanometer and Angstrom scales has made it an essential tool for imaging surfaces in applications ranging from semiconductor processing to cell biology. In addition to this topographical imaging, however, the AFM can also probe nanomechanical and other fundamental properties of sample surfaces, including their local adhesive or elastic (compliance) properties.


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