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微区XRF分析宝石夹杂物
发布时间：
2016-09-30 10:00
来源：
HORIBA科学仪器事业部
| 领域： | 地矿/钢铁/有色金属 | ||
| 样品： | 宝石夹杂物 | 项目： | 元素组成 |
| 方案文件名 | 下载 |
|---|---|
微区XRF分析宝石夹杂物 |
下载此篇方案 |
X-ray fluorescence micro-analysis provides an ideal technique to quickly characterise inclusions and flaws in gemstones. The optimised beam collimation possible with the XGT-5000 means that even inclusions which are buried deep within a (transparent) gem can be accurately analysed. The options for 10 μm and 100 μm beam diameters are well suited for analysis of inclusions with a range of sizes.
