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领域: | 电子/电器/半导体 | ||
样品: | 有机半导体 | 项目: | 光学常数 |
方案文件名 | 下载 |
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使用椭圆偏振光谱仪对有机半导体进行光学表征 |
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When compared with other optical metrology instruments the unique strengths of spectroscopic ellipsometers are based on their highly precise and simple experimental measurements plus physical and material information derived from optical constants characterization.