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领域: | 电子/电器/半导体 | ||
样品: | OLED封装器件 | 项目: | 厚度,光学常数 |
方案文件名 | 下载 |
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表征OLED封装器件的厚度和光学常数-研究OLED的老化过程 |
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Spectroscopic ellipsometry is a powerful technique to characterize the thickness and optical constants of encapsulated OLED devices.
For the case of non-transparent encapsulation thecombination of ellipsometric measurements via the glass substrate and the powerful modelling features of DeltaPsi2 software make it possible to analyze “this reverse sample”.
Ellipsometric investigation of a 1-month aging process for an α-NPD film show a significant decrease of the refractive index, suggesting a decrease in the material density.