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Introduction
The VERTEX Fourier Transform Infrared (FTIR)
spectrometer series are applied for the accurate
Transmittance, Absorbance and Reflectance measurements
of solid samples at room and low temperatures. Therefore
such FTIR spectrometers are used in the area of solid
state physics as a research measurement tool for the
development of detector material commonly [1, 2 and 3].
Beside the analysis of detector material as well there is the
need to characterize the finally designed detector devices.
Bruker provides the necessary optical, electronics and
software adaptations to apply the VERTEX high-end R&D
FTIR for general principles of detector characterization.