SOLVER NEXT is the state-of-the-art NT-MDT development, designed to meet a researcher’s current and future needs. This innovative device at the forefront of scientific research opens up new paths of study in different fields of nanotechnology, providing all user levels with a full range of conventional SPM measuring techniques (such as topography, phase imaging, nanolithography and more).

The novel dual head system of the Solver Next offers both atomic force (AFM) and scanning tunnelling microscopy (STM) under one hood. This enables researchers to gain the fastest time to results, excellent performance, increased accuracy, high reliability and unprecedented ease-of-use with no loss in resolution. The flexible, sleek and functional system incorporates smart software, automated head exchange, and motorized sample positioning under video monitored control. This allows for high quality images without the need for specially trained operators.

The system has closed-loop sensors to compensate for inherent piezoelectric imperfections such as scan nonlinearity, creep and hysteresis. With two additional removable heads for operating in liquid environments and nanoindentation you have the freedom to work with a variety of samples, measuring modes and conditions.

The Solver Next has an advanced controller with a vast library of scripts and MAC® compatibility. The result is a image-friendly operating system well-suited to large file, 3-dimensional mathematics and manipulation.

The Solver Next provides a robust, diverse, and economic solution for classroom, industrial, routine biological and pharmaceutical labs, and makes AFM and STM accessible to a broader audience, even offering a special iPhoneTM applet for simple image analysis and image sharing.

测量系统
测量头部                           AFM和STM测量头全内置、全自动切换
                                           可选配液相模式和纳米压痕测量头

zei大样品尺寸 Up to 20 mm in diameter; up to 10 mm in height
直径20mm，厚度10mm
Sample weight
zei大样品重量 Up to 100 g
100g
XY sample positioning
XY样品定位装置 5x5 mm, motorized, video monitored
移动范围5X5mm，软件控制电动定位
Minimum XY sample positioner step
XY样品定位装置zei小步进 0.3 μm
Scanning field
扫描范围 100x100x10 μm with closed-loop sensors;
100X100X10um，三维全量程闭环控制扫描器
3x3x2 μm in the low voltage mode
3x3x2 μm，低电流模式扫描器
Nonlinearity, XY
XY方向非线性度 <=0.1 % (with closed-loop sensors)
<=0.1 % (闭环控制扫描器)
Noise level Z (RMS in the bandwidth of 10–1000 Hz)
Z方向噪音水平（带宽10~1000Hz时的RMS值） 0.03 nm (typically), 0.04 nm (maximum) — with closed-loop sensors; 0.02 nm in the low voltage mode
闭环控制扫描器，典型值0.03nm，zei大0.04nm
低电流模式扫描器，0.02nm
Optical system for cantilever deviation registration
激光光路系统 Motorized, automated system alignment
电动调节，全自动准直
Video monitoring system
视频显微镜系统 Motorized continuous zooming, focusing, sample location positioning, resolution 2 μm
软件控制电动变焦和连续变倍，软件控制变换视野，分辨率2um
Temperature control of the sample
样品温度控制 Room temperature up to 150°C
室温~150°C

HeadHiPEX™ (Head High Precision Exchange) system is intended for measuring head management. HeadHiPEX™ is a completely automated system able to change built-in and external measuring heads maintaining their position under the sample with very high precision
Automatic multifunctional enclosure IsoShield™ system which is keeping samples in highly homogenous environment, like uniform temperature field, constant and controllable humidity, negligible level of parasitic electromagnetic fields and electrostatic free staging. The system incorporates an additional safety feature for users that disables the laser beam automatically when the door is open
Precision Instrument Navigation System PINpoint™ provides easy-to-use navigation allowing precision sample and optical viewing system positioning
ExpertFBA™ (Expert Fine Beam Alignment System) is a fully automated system for the perfect alignment of the cantilever, laser and photodiode
Electronic adjustment system of scanning field size ScanScaler™ provides easy-to-manage automatic adjustment of scan mode between large (up to 100 um) and small (atomiс scale) samples
Automated alignment of optical feedback geometry (cantilever–laser–photodiode)
Motorized focus and zoom of the optical view
Automated software driven control of measurement modes
All basic Atomic Force Microscopy techniques — topography, phase imaging, measurement of electric properties, nanolithography and more
Scanning Tunneling Microscopy
Wide range of operating conditions for experimentation — in air or liquid
Low-noise capacitive closed-loop feedback in all three directions (XYZ) provides precision Nanometrology
Atomic resolution

多功能全自动扫描探针显微镜信息由俄罗斯NT-MDT公司上海代表处（恩特-梦迪特服务和物流有限公司）为您提供，如您想了解更多关于多功能全自动扫描探针显微镜报价、型号、参数等信息，欢迎来电或留言咨询。

注：该产品未在中华人民共和国食品药品监督管理部门申请医疗器械注册和备案，不可用于临床诊断或治疗等相关用途