Raman spectrum of Si wafer. Si (4) peak is clearly detected. Si (1) and Si (2) are in deep saturation. Confocal mode. Accumulation time - 60 seconds. 488 nm laser, 5 mW power
Signal decrease from 90 % to 10 % at 200 nm, λ=514 nm, 100Х immersion lens
Resolution along Z-axis.The reflection from silicon wafer, obtained by moving the objective lens along the Z axis.
FW HW - 442 nm, λ=488 nm, 100x objective lens.
Specially designed monochromator-spectrograph with unique parameters:spectral resolution up to 0.006 nm, astigmatism less than 5 μm.Absolute wavelength accurasy: about 0.016 nm(for grating 2400 l/mm).Pinhole spectral image at CCD camera.Pixel size: 12 μm.Pinhole size: 12 μm. Image size: 1.5 pixel