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Epsilon 5采用K系列线完善的检测限测定土壤和岩石中的Cd, Sn, Sb, Cs, Ba, La, Ce 、Nd
发布时间：
2016-06-03 16:17
来源：荷兰帕纳科公司
| 领域： | 土壤 | ||
| 资料类型： | 其他资料 | ||
下载地址2：Epsilon 5采用K系列线完善的检测限测定土壤和岩石中的Cd, Sn, Sb, Cs, Ba, La, Ce 、Nd
Analysis of Cd, Sn, Sb, Cs, Ba,La, Ce and Nd in rocks and soils–improved detection limits using K-series lines
Introduction
X-ray fluorescence spectrometry is used extensively for geochemical analysis. Simple sample preparation, accuracy, precision and good to excellent detection limits across large parts of the periodic table are the principal reasons for this choice. Detection limits for typical medium-power wavelength-dispersive spectrometers (WDXRF) configured for geological applications are illustrated in Figure 1.